By using a Talbot-Lau interferometer three image modalities are obtained:
The attenuation image, the differential phase image and the dark-field image.
Thus, the X-ray Talbot-Lau imaging method provides additional informations about the inner structure of materials which are not visible in conventional X-ray attenuation imaging. Especially the X-ray dark-field image includes signals generated by structures on scales below the position resolution of the imaging system. Hence, it offers the possibility to detect fine cracks, air inclusions and porosity in non-destructive testing.